Knowledge Base
Semiconductor Reliability
Learn more about our various reliability testing services including our Semiconductor Reliability Testing. The article below explains the importance of Semiconductor Reliability . The reliability of semiconductor devices can be related to the failure rate curve called...
Early Semiconductor Failures
A semiconductor device usually fails mainly because experiencing situations that stress the semiconductor past its maximum ratings. The means a device stops working is known as a mechanism failure. Typically, electricity, heat, mechanical stresses, and other factors...
Semiconductor Random Failures
Engineers and scientists have studied failures so often that they now have models, or equations, that we can use to predict when failures will occur. These models don’t forecast if a distinct semiconductor device may fail, but they can forecast with confidence the...
Semiconductor Wear-out Failures
Semiconductors fail whenever they hit the capabilities of their basic durability. This period is named the region of wear-out failures, and reveals the life of various failure modes of semiconductors. Wear-out failures differ with variations in the stresses applied to...
Burn-in Testing
Burn-In Tester: Reliability & Test Equipment Burn-in testing is the process by which a system detects early failures in semiconductor components (infant mortality), thereby increasing a semiconductor component reliability. This burn in process is a vital testing...
Laser Diode Reliability
The majority of semiconductor device reliability modeling is done using the exponential probability distribution model, which assumes the semiconductor has a constant failure rate and there is no wear-out mechanism. However, there are a number of factors which affect...
Why product reliability is so important
We expect our cars, computers, electrical appliances, lights, televisions, etc. to function whenever we need them - day after day, year after year. In today's technological world nearly everyone depends upon the continued functioning of a wide array of complex...
Laser Diode LIV
Laser diodes, the devices that illuminate telecom fiber-optic cables, require light-current-voltage (LIV) measurements during production. These measurements let you characterize a laser diode's light output and forward voltage as a function of input current. Testing a...
HALT Testing
Understanding the Highly Accelerated Life Test (HALT): A Comprehensive Guide Learn more about our various reliability testing services including our HALT Testing Services. The article below explains the process of HALT and why it is important. Highly accelerated life...
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