by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
MTBF Calculation & Product Reliability MTBF is commonly confused with a component’s useful life, even though the two principles are not related in any way. For example, a battery may have a useful life of four hours and an MTBF of 100,000 hours. These statistics...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Silicon microchips are produced in a process that’s a combination of the familiar and the weird. Some facets are as familiar as creating a photograph in a dark room, whereas many others are like space exploration or subatomic physics. In the end, it all comes...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Failure In Time (FIT) is another way of reporting MTBF. FIT reports the amount of expected failures per one billion hours of operation for a device. This term is used particularly by the semiconductor industry it is also used by component manufacturers. FIT can be...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Mean Time to Repair Mean Time To Repair (MTTR) is the time needed to fix a failed component or module. In an operational system, repair always means upgrading a failed component or device. MTTR could be seen as mean time for you to replace a failed equipment module....
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Reliability Assurance Requirement for Optoelectronic Devices Component level qual (Laser diode, LED, PD, …) Mechanical, environment and electrical Tests in parallel Integrity tests – harsh test conditions Long duration Sampling Plan Optical electrical functional...
