by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Learn more about our various reliability testing services including our Semiconductor Reliability Testing. The article below explains the importance of Semiconductor Reliability . The reliability of semiconductor devices can be related to the failure rate curve called...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
A semiconductor device usually fails mainly because experiencing situations that stress the semiconductor past its maximum ratings. The means a device stops working is known as a mechanism failure. Typically, electricity, heat, mechanical stresses, and other factors...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Engineers and scientists have studied failures so often that they now have models, or equations, that we can use to predict when failures will occur. These models don’t forecast if a distinct semiconductor device may fail, but they can forecast with confidence the...
by Electron Test Equipment | Jul 26, 2018 | Semiconductor Testing
Semiconductors fail whenever they hit the capabilities of their basic durability. This period is named the region of wear-out failures, and reveals the life of various failure modes of semiconductors. Wear-out failures differ with variations in the stresses applied to...
by Electron Test Equipment | Jul 15, 2018 | Laser Diodes, Semiconductor Testing
The majority of semiconductor device reliability modeling is done using the exponential probability distribution model, which assumes the semiconductor has a constant failure rate and there is no wear-out mechanism. However, there are a number of factors which affect...
by Electron Test Equipment | Jul 12, 2018 | Semiconductor Testing
We expect our cars, computers, electrical appliances, lights, televisions, etc. to function whenever we need them – day after day, year after year. In today’s technological world nearly everyone depends upon the continued functioning of a wide array of...
