Photodiode Test Systems
Our ATE Photodiode Test systems ensure your photodiodes meet demanding military and telecom reliability standards by testing your photodiode device in conditions such as: thermal shock (as low as -75° C), humidity ( 20% to 95% RH), or high temperatures ( up to 180° C) for burn-in and accelerated aging.
Burn-in, Humidity & Reliability Testing
Our Burn-in Test & Product Reliability System for photodiodes provide a cost effective and high-performance system for accelerated life testing, burn-in, and humidity testing.
Versatile Testing
Easily test various photodiode packages including TO or butterfly type.
Humidity & Sub Zero Testing
Flexibility to test with various environmental chambers for HALT, humidity and sub-zero temperature testing.
Software & Reporting
Easy to navigate dashboard and functional graphing & reporting with remote access.
Measurement & Tests
The test system measures: Dark Current, I-V, Voc, Isc, Vmax, Imax, Imin. Reliability testing: FIT & MTTF.
Find out how you can save your company millions and increase performance of your devices using the most advanced automatic test equipment for reliability testing .
HEAD OFFICE
Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Ireland
Phone: + 353 1 902 6678
E-mail:
info@electrontest.com