+353 1 902 6678 [email protected]

Photodiode Reliability &
Accelerated Life Testing System

The custom Product Reliability Tester (PRT) is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for photodiodes specifically used in telecommunication, satellite, aerospace and military applications.

Types of Testing

The versatile PRT-PD-XX provides three easy testing conditions at your facility for your photodiode semiconductors.

photodiode burn-in test

Photodiode Burn-in Test

photodiode burn-in test

Photodiode Accelerated Aging

photodiode burn-in test

Photodiode Qualification Testing

Accelerated Lifetime Testing for Photodiodes

With the rapid advancements in the electronics industry, accelerated life testing or accelerated aging testing has become extremely important as a practical and efficient method of evaluating photodiode semiconductor reliability. Innova Semiconductors manufacturers the PRT-PD-XX Product Reliability Tester which is a portable and modular system that works with all environmental chambers for accelerated life testing of up to 1024 photodiode components at a time.

PRT-PR-XX Features

The PRT-PR comes with various hardware configurations and is customizable for various stress test conditions for your semiconductors and ICs.

Standard Features include:

  • Test up to 1024 semiconductor photodiodes per module
  • Power Monitoring & UPS Backup
  • Ethernet Communication
  • Custom Input & Output Interface Connectors (BNC,
  • Ethernet Communication
  • Custom interface control with third party environmental chambers

Test Standards

With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE.

Packaged IC

For packaged ICs, we manufacture a custom interface fixture for packaged photodiodes to ensure proper connectivity and test reliability.

Wafer Level Testing

For wafer level testing on photodiodes, we provide custom designed wafer probers and test fixtures for all photodiode applications.

Software Support

Our dedicated support staff provides outstanding training and will help your team configure the software for your application.

Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.

Designed to Work With All Environmental Test Chambers

The PRT-PD-XX works with all environmental test chambers for various stress tests for your semiconductor:

  • High Temperature Operating Life Test (HTOL)
  • Low Temperature Operating Life Test (LTOL)
  • Temperature and Humidity Test
  • Temperature and Humidity Bias Test (THB)
  • Autoclave Test
  • Highly Accelerated Stress Test (HAST), Bias or Unbiased
  • High Temperature Storage
  • Moisture Sensitivity Level
  • Moisture Pre-conditioning

Reliability TestFIT (Failure In Time), MTTF (Mean Time to Failure)
Measured QuantitiesDark Current, I-V, Voc,
Isc, Vmax, Imax, Imin
, Isc, Vmax, Imax, Imin
Number Test Components 64 - 1024
Voltage Range0 - 44 VDC
Voltage Accuracy (Measured)0.1% + -15mV
Current Range 100nA – 32,000nA
Current Accuracy (Measured)0.5% @ 2000nA
Source Measure BoardCustom Interface Board
Voltage Programming Resolution 0.1 V to 5 V, 64 steps
Maximum Current32,000nA
Default Current Measurement ResolutionAnalog to Digital 13 bit
Scan Time2 to 6 seconds
Input Voltage110V -240V AC
Power Consumption125 Watts
System Dimensions (mm)L-515 x W-477 x H-395

Increases semiconductor reliability through accurate and affordable semiconductor reliability testing that measures up to 1024 photodiode components simultaneously.