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Photodiode Reliability &
Accelerated Life Testing System

The custom Photodiode Test System is a scalable system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for photodiodes specifically used in military, telecommunication, and aerospace applications.

The Photodiode test system offers versatile environmental tests of your semicondutor for humidity, sub-zero, and high temperature testing.

Types of Testing

The versatile Photodiode Test System provides three easy testing conditions in various environmental conditions for your photodiode semiconductors.

photodiode burn-in test

Photodiode Burn-in Test

photodiode burn-in test

Photodiode Accelerated Aging

photodiode burn-in test

Photodiode Qualification Testing

Burn-in & Reliability Testing of Photodiodes

With the rapid advancements in the electronics industry, accelerated life testing or accelerated aging testing has become extremely important as a practical and efficient method of evaluating photodiode semiconductor reliability. Electron Test Equipment manufactures the ATE (Automated Test Equipment) Photodiode Test System which is a portable and scalable system that works with all environmental chambers for accelerated life testing of 64 to 1024 photodiode components at a time.

Versatile Temperature Control

With need for higher accuracy semiconductor devices used in military applications and the rise of 400G communication networks, semiconductor manufacturers are required to test photodiodes in extreme environmental conditions.

The ATE Photodiode System is versatile and will work with your existing environmental chambers or can be supplied with an environmental chamber that can maintain demanding temperature conditions:

  • Sub-zero thermal shock (as low as -75° C)
  • Humidity ( 20% to 95% RH)
  • High temperatures ( up to 180° C) for burn-in and accelerated aging

 

Test Standards

With advanced software test configurations, you can customize settings that meet various organization test standards for military or telecom such as the Telcordia (Bellcore) GR-468-CORE.

Packaged IC

For packaged ICs, we manufacture a custom interface fixture for packaged photodiodes to ensure proper connectivity and test reliability.

Software Support

Our dedicated support staff provides outstanding training and will help your team configure the software for your application.

Depending on your requirements, the software can be customized to meet your semiconductor test requirements.

When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.

Designed to Work With All Environmental Test Chambers

The ATE Photodiode Test System works with all environmental test chambers for various stress tests for your semiconductor:

  • High Temperature Operating Life Test (HTOL)
  • Low Temperature Operating Life Test (LTOL)
  • Temperature and Humidity Test
  • Temperature and Humidity Bias Test (THB)
  • Autoclave Test
  • Highly Accelerated Stress Test (HAST), Bias or Unbiased
  • High Temperature Storage
  • Moisture Sensitivity Level
  • Moisture Pre-conditioning

Reliability TestFIT (Failure In Time), MTTF (Mean Time to Failure)
Measured QuantitiesDark Current, I-V, Voc,
Isc, Vmax, Imax, Imin
, Isc, Vmax, Imax, Imin
Number Test Components 64 - 1024
Voltage Range0 - 44 VDC
Voltage Accuracy (Measured)0.1% + -15mV
Current Range 100nA – 32,000nA
Current Accuracy (Measured)0.5% @ 2000nA
Source Measure BoardCustom Interface Board
Voltage Programming Resolution 0.1 V to 5 V, 64 steps
Maximum Current32,000nA
Default Current Measurement ResolutionAnalog to Digital 13 bit
Scan Time2 to 6 seconds
Input Voltage110V -240V AC
Power Consumption125 Watts
System Dimensions (mm)L-515 x W-477 x H-395
Material:Aluminum/Steel

Increases semiconductor reliability through accurate and affordable semiconductor reliability testing that tests 64 to 1024 photodiode components in various environmental conditions such as humidity, sub-zero temp, and high temperature.