Photodiode Reliability &
Accelerated Life Testing System
The custom Product Reliability Tester (PRT) is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for photodiodes specifically used in telecommunication, satellite, aerospace and military applications.
Types of Testing
The versatile PRT-PD-XX provides three easy testing conditions at your facility for your photodiode semiconductors.
Photodiode Burn-in Test
Photodiode Accelerated Aging
Photodiode Qualification Testing
Accelerated Lifetime Testing for Photodiodes
With the rapid advancements in the electronics industry, accelerated life testing or accelerated aging testing has become extremely important as a practical and efficient method of evaluating photodiode semiconductor reliability. Innova Semiconductors manufacturers the PRT-PD-XX Product Reliability Tester which is a portable and modular system that works with all environmental chambers for accelerated life testing of up to 1024 photodiode components at a time.
The PRT-PR comes with various hardware configurations and is customizable for various stress test conditions for your semiconductors and ICs.
Standard Features include:
- Test up to 1024 semiconductor photodiodes per module
- Power Monitoring & UPS Backup
- Ethernet Communication
- Custom Input & Output Interface Connectors (BNC,
- Ethernet Communication
- Custom interface control with third party environmental chambers
With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE.
For packaged ICs, we manufacture a custom interface fixture for packaged photodiodes to ensure proper connectivity and test reliability.
Wafer Level Testing
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
Designed to Work With All Environmental Test Chambers
The PRT-PD-XX works with all environmental test chambers for various stress tests for your semiconductor:
- High Temperature Operating Life Test (HTOL)
- Low Temperature Operating Life Test (LTOL)
- Temperature and Humidity Test
- Temperature and Humidity Bias Test (THB)
- Autoclave Test
- Highly Accelerated Stress Test (HAST), Bias or Unbiased
- High Temperature Storage
- Moisture Sensitivity Level
- Moisture Pre-conditioning
|Reliability Test||FIT (Failure In Time), MTTF (Mean Time to Failure)|
|Measured Quantities||Dark Current, I-V, Voc,
Isc, Vmax, Imax, Imin
, Isc, Vmax, Imax, Imin
|Number Test Components||64 - 1024|
|Voltage Range||0 - 44 VDC|
|Voltage Accuracy (Measured)||0.1% + -15mV|
|Current Range||100nA – 32,000nA|
|Current Accuracy (Measured)||0.5% @ 2000nA|
|Source Measure Board||Custom Interface Board|
|Voltage Programming Resolution||0.1 V to 5 V, 64 steps|
|Default Current Measurement Resolution||Analog to Digital 13 bit|
|Scan Time||2 to 6 seconds|
|Input Voltage||110V -240V AC|
|Power Consumption||125 Watts|
|System Dimensions (mm)||L-515 x W-477 x H-395|
Increases semiconductor reliability through accurate and affordable semiconductor reliability testing that measures up to 1024 photodiode components simultaneously.
Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Phone: + 353 1 902 6678