Photodiode Reliability &
Accelerated Life Testing System
The custom Photodiode Test System is a scalable system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for photodiodes specifically used in military, telecommunication, and aerospace applications.
The Photodiode test system offers versatile environmental tests of your semicondutor for humidity, sub-zero, and high temperature testing.
Types of Testing
The versatile Photodiode Test System provides three easy testing conditions in various environmental conditions for your photodiode semiconductors.
Photodiode Burn-in Test
Photodiode Accelerated Aging
Photodiode Qualification Testing
Burn-in & Reliability Testing of Photodiodes
With the rapid advancements in the electronics industry, accelerated life testing or accelerated aging testing has become extremely important as a practical and efficient method of evaluating photodiode semiconductor reliability. Electron Test Equipment manufactures the ATE (Automated Test Equipment) Photodiode Test System which is a portable and scalable system that works with all environmental chambers for accelerated life testing of 64 to 1024 photodiode components at a time.
Versatile Temperature Control
With need for higher accuracy semiconductor devices used in military applications and the rise of 400G communication networks, semiconductor manufacturers are required to test photodiodes in extreme environmental conditions.
The ATE Photodiode System is versatile and will work with your existing environmental chambers or can be supplied with an environmental chamber that can maintain demanding temperature conditions:
- Sub-zero thermal shock (as low as -75° C)
- Humidity ( 20% to 95% RH)
- High temperatures ( up to 180° C) for burn-in and accelerated aging
With advanced software test configurations, you can customize settings that meet various organization test standards for military or telecom such as the Telcordia (Bellcore) GR-468-CORE.
For packaged ICs, we manufacture a custom interface fixture for packaged photodiodes to ensure proper connectivity and test reliability.
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements.
When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
Designed to Work With All Environmental Test Chambers
The ATE Photodiode Test System works with all environmental test chambers for various stress tests for your semiconductor:
- High Temperature Operating Life Test (HTOL)
- Low Temperature Operating Life Test (LTOL)
- Temperature and Humidity Test
- Temperature and Humidity Bias Test (THB)
- Autoclave Test
- Highly Accelerated Stress Test (HAST), Bias or Unbiased
- High Temperature Storage
- Moisture Sensitivity Level
- Moisture Pre-conditioning
|Reliability Test||FIT (Failure In Time), MTTF (Mean Time to Failure)|
|Measured Quantities||Dark Current, I-V, Voc,
Isc, Vmax, Imax, Imin
, Isc, Vmax, Imax, Imin
|Number Test Components||64 - 1024|
|Voltage Range||0 - 44 VDC|
|Voltage Accuracy (Measured)||0.1% + -15mV|
|Current Range||100nA – 32,000nA|
|Current Accuracy (Measured)||0.5% @ 2000nA|
|Source Measure Board||Custom Interface Board|
|Voltage Programming Resolution||0.1 V to 5 V, 64 steps|
|Default Current Measurement Resolution||Analog to Digital 13 bit|
|Scan Time||2 to 6 seconds|
|Input Voltage||110V -240V AC|
|Power Consumption||125 Watts|
|System Dimensions (mm)||L-515 x W-477 x H-395|
Increases semiconductor reliability through accurate and affordable semiconductor reliability testing that tests 64 to 1024 photodiode components in various environmental conditions such as humidity, sub-zero temp, and high temperature.
Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Phone: + 353 1 902 6678