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Knowledge Base

MTBF Calculation

MTBF Calculation & Product Reliability MTBF is commonly confused with a component’s useful life, even though the two principles are not related in any way. For example, a battery may have a useful life of four hours and an MTBF of 100,000 hours. These statistics...

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How Semiconductor Microchips Are Made

Silicon microchips are produced in a process that's a combination of the familiar and the weird. Some facets are as familiar as creating a photograph in a dark room, whereas many others are like space exploration or subatomic physics. In the end, it all comes together...

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FIT (Failure in Time) Calculation

Failure In Time (FIT) is another way of reporting MTBF. FIT reports the amount of expected failures per one billion hours of operation for a device. This term is used particularly by the semiconductor industry it is also used by component manufacturers. FIT can be...

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Mean Time To Repair (MTTR)

Mean Time to Repair Mean Time To Repair (MTTR) is the time needed to fix a failed component or module. In an operational system, repair always means upgrading a failed component or device. MTTR could  be seen as mean time for you to replace a failed equipment module....

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MIL-STD-883 standard

The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of...

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Telcordia (Bellcore) GR-468-CORE

Reliability Assurance Requirement for Optoelectronic Devices Component level qual (Laser diode, LED, PD, …) Mechanical, environment and electrical Tests in parallel Integrity tests - harsh test conditions Long duration Sampling Plan Optical electrical functional...

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Semiconductor Reliability

The reliability of semiconductor devices can be related to the failure rate curve called the: bathtub curve. This curve can be divided into the three following regions: Early failures: which take place within a relatively short time after a device begins to be used...

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Early Semiconductor Failures

A semiconductor device usually fails mainly because experiencing situations that stress the semiconductor past its maximum ratings. The means a device stops working is known as a mechanism failure. Typically, electricity, heat, mechanical stresses, and other factors...

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Semiconductor Random Failures

Engineers and scientists have studied failures so often that they now have models, or equations, that we can use to predict when failures will occur. These models don’t forecast if a distinct semiconductor device may fail, but they can forecast with confidence the...

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