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Knowledge Base

VCSEL Laser Diode Applications

What is VCSEL (VERTICAL CAVITY SURFACE EMITTING LASER)? VCSEL laser diodes are a semiconductor "vertical cavity surface emitting laser" diode that emits light in a cylindrical beam vertically from the surface of a fabricated wafer...

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MTBF Calculation

MTBF Calculation & Product Reliability MTBF is commonly confused with a component’s useful life, even though the two principles are not related in any way. For example, a battery may have a useful life of four hours and an MTBF of 100,000 hours. These statistics...

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How Semiconductor Microchips Are Made

Silicon microchips are produced in a process that's a combination of the familiar and the weird. Some facets are as familiar as creating a photograph in a dark room, whereas many others are like space exploration or subatomic physics. In the end, it all comes together...

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FIT (Failure in Time) Calculation

Failure In Time (FIT) is another way of reporting MTBF. FIT reports the amount of expected failures per one billion hours of operation for a device. This term is used particularly by the semiconductor industry it is also used by component manufacturers. FIT can be...

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Mean Time To Repair (MTTR)

Mean Time to Repair Mean Time To Repair (MTTR) is the time needed to fix a failed component or module. In an operational system, repair always means upgrading a failed component or device. MTTR could  be seen as mean time for you to replace a failed equipment module....

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MIL-STD-883 standard

The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of...

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Telcordia (Bellcore) GR-468-CORE

Reliability Assurance Requirement for Optoelectronic Devices Component level qual (Laser diode, LED, PD, …) Mechanical, environment and electrical Tests in parallel Integrity tests - harsh test conditions Long duration Sampling Plan Optical electrical functional...

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Semiconductor Reliability

Learn more about our various reliability testing services including our Semiconductor Reliability Testing. The article below explains the importance of Semiconductor Reliability . The reliability of semiconductor devices can be related to the failure rate curve called...

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Early Semiconductor Failures

A semiconductor device usually fails mainly because experiencing situations that stress the semiconductor past its maximum ratings. The means a device stops working is known as a mechanism failure. Typically, electricity, heat, mechanical stresses, and other factors...

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