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Semiconductor Testing for Industry 

 ElectronTest has built a strong reputation as a leading supplier of advanced semiconductor testing equipment. Our commitment to precision, reliability, and innovation has established us as the go-to provider for several high-stakes industries, including avionics, space, and telecommunications.

The custom Semiconductor Test System is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for up to 1024 laser diodes specifically used in telecommunication, satellite, aerospace and military applications.

We collaborate with semiconductor companies to provide advanced testing solutions that help reduce development time, solve yield problems, and ensure the integrity of critical materials supply chain for semiconductor manufacturing companies. We provide test solutions for integrated circuits for the semiconductor industry.



Why Use Accelerated Lifetime Testing & Burn-in for Laser Diodes

With the rapid advancements in the semiconductor industry, reliability is a concern in every laser diode application. Laser diode life testing or accelerated aging is extremely important as part of qualification during product development as well
as for batch testing throughout the production life of the laser.

As well, high-temperature burn-in tests are used in laser diode manufacturing to filter out components that will be prone to premature failure and ensure the remaining lot of laser diodes will meet the acceptable level of reliability based on the test standard used.

semiconductor testing

Versatile Temperature Control

With the rise of 400G communication networks and higher accuracy laser guided devices used in military applications, semiconductor manufacturers are required to test their laser diodes in extreme environmental conditions.

The semiconductor testing machine is versatile and will work with your existing environmental chambers or can be equipped with a chamber that can maintain demanding temperature conditions:

  • Sub-zero thermal shock (as low as -75° C)
  • Humidity ( 20% to 95% RH)
  • High temperatures ( up to 180° C) for burn-in and accelerated aging


Electron Test Complete Portfolio of Semiconductor Test Solutions

Our semiconductor test equipment are designed to meet the needs of developers and manufacturers of stand-alone integrated circuits, system on a chip and system in package devices. Our hardware and software development teams create unique modular tester architectures, expand site count and lower the cost-of-test for industry-leading silicon manufacturers and OSATs around the world.


Test engineers buy our semiconductor test equipment because of its low cost per testing channel. These next generation test equipment are used to test the chip’s performance for physical damage. Our semiconductor devices can detect the risk of packaged chips and these are measured using our hardware.

Laser Diode Burn-in

The laser diode burn-in test can be used to test up from 64 to 1024 laser diodes at a time to identify and remove faulty lasers that would experience pre-mature failure in the field.

Semiconductor Test Standards

With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.

Software Support for Semiconductor Testing

Our dedicated support staff provides outstanding training and will help your team configure the software for your application.

Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.

Semiconductor Tester Works with all Environmental Test Chambers

The PRT-LASER works with all environmental test chambers for various stress tests for your laser diode semiconductor:

  • High Temperature Operating Life Test (HTOL)
  • Low Temperature Operating Life Test (LTOL)
  • Temperature and Humidity Test
  • Temperature and Humidity Bias Test (THB)
  • Autoclave Test
  • Highly Accelerated Stress Test (HAST), Bias or Unbiased
  • High Temperature Storage
  • Moisture Sensitivity Level
  • Moisture Pre-conditioning

Semiconductor Specifications & Gallery

Reliability Test FIT (Failure In Time), MTTF (Mean Time to Failure)
Measured Quantities LIV Curve, Threshold Current, Operating Current, Forward Voltage, Monitoring Current, Vmax, Imax, Imin
Number Test Components 64 – 1024
Voltage Accuracy (Measured) 0.1% + -15mV
Current Range 1mA – 5,000 mA
Current Accuracy (Measured) 0.1% of Full Scale
Source Measure Board Custom Interface Test Fixture
Voltage Programming Resolution 0.1 V to 5 V, 64 steps
Maximum Current 5,000mA
Default Current Measurement Resolution Analog to Digital 13 bit
Scan Time 2 to 6 seconds
Input Voltage 110V – 240V AC
Power Consumption 220 Watts
System Dimensions (mm) L-515 x W-477 x H-395 (size based on 64 component testing)
Material: Aluminum/Steel

Increase semiconductor reliability through precise and affordable semiconductor testing that measures 64 to 1024 laser diode semiconductors in sub-zero, humidity, and high temperature conditions.