Semiconductors fail whenever they hit the capabilities of their basic durability. This period is named the region of wear-out failures, and reveals the life of various failure modes of semiconductors. Wear-out failures differ with variations in the stresses applied to the device as it is being utilized.
Over the years, users have demanded more reliable electronic equipment. On top of that, electronic equipment is continuing to grow a lot more complex. The blend among these two factors has put great increased exposure of the necessity to ensure trouble-free operation over a long period. Failure analysis can provide valuable insight into the mechanisms and causes of failure, which, in turn, result in improvements in the design of components and products and thus assist in improving the reliability of semiconductor products and systems.
