by Electron Test Equipment | Jul 26, 2018 | Burn-in Test
Burn-in testing is the process by which a system detects early failures in semiconductor components (infant mortality), thereby increasing a semiconductor component reliability. Normally burn-in tests are performed on electronic devices such as laser diodes with an...
by Electron Test Equipment | Feb 2, 2018 | Burn-in Test
Wafer-level Test and Burn-in (WLTBI) refers to the process of subjecting semiconductor devices to electrical testing and burn-in while they are still in wafer form. The increasing complexity of SoC (System on Chip: commonly known as an “IC” or “chip”) has placed...
by Electron Test Equipment | Jan 30, 2018 | Burn-in Test
A burn-in chamber is an environmental oven used to evaluates the reliability of multiple semiconductor devices and performs large capacity screenings for premature failure (infant mortality). These environmental chambers are designed for static and dynamic burn-in of...
by Electron Test Equipment | Jan 15, 2018 | Burn-in Test
Semiconductor equipment that test and screen out early failures during the “infant mortality” stage are put on a board known as “Burn-in Board”. On a burn-in board, there are multiple sockets to place the semiconductor device (ie. laser diode or photodiode). The...
