Knowledge Base
Semiconductor Testing Software Solutions for Advanced Chips
The Importance of Advanced Semiconductor Testing The semiconductor industry is rapidly evolving, with increasing demand for advanced chips and complex semiconductor devices. Advanced semiconductor testing software is crucial for ensuring the reliability and...
Semiconductor Testing Companies
Explore the forefront of semiconductor testing with our curated list of industry leaders, renowned for their cutting-edge technology and exceptional service.In the semiconductor industry, ensuring the quality and reliability of semiconductor devices is paramount....
VCSEL Laser Diode Applications
What is VCSEL (VERTICAL CAVITY SURFACE EMITTING LASER)? VCSEL laser diodes are a semiconductor "vertical cavity surface emitting laser" diode that emits light in a cylindrical beam vertically from the surface of a fabricated wafer...
MTBF Calculation
MTBF Calculation & Product Reliability MTBF is commonly confused with a component’s useful life, even though the two principles are not related in any way. For example, a battery may have a useful life of four hours and an MTBF of 100,000 hours. These statistics...
How Semiconductor Microchips Are Made
Silicon microchips are produced in a process that's a combination of the familiar and the weird. Some facets are as familiar as creating a photograph in a dark room, whereas many others are like space exploration or subatomic physics. In the end, it all comes together...
FIT (Failure in Time) Calculation
Failure In Time (FIT) is another way of reporting MTBF. FIT reports the amount of expected failures per one billion hours of operation for a device. This term is used particularly by the semiconductor industry it is also used by component manufacturers. FIT can be...
Mean Time To Repair (MTTR)
Mean Time to Repair Mean Time To Repair (MTTR) is the time needed to fix a failed component or module. In an operational system, repair always means upgrading a failed component or device. MTTR could be seen as mean time for you to replace a failed equipment module....
MIL-STD-883 standard
The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of...
Telcordia (Bellcore) GR-468-CORE
Reliability Assurance Requirement for Optoelectronic Devices Component level qual (Laser diode, LED, PD, …) Mechanical, environment and electrical Tests in parallel Integrity tests - harsh test conditions Long duration Sampling Plan Optical electrical functional...
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