by Electron Test Equipment | Apr 26, 2018 | Laser Diodes
A laser diode falls under the category of optoelectronics which is a branch of electronics that deals with light-emitting and light-detecting devices. A laser diode is a special LED or IRED with a relatively large and flat P-N junction. How a Laser Diode Works Laser...
by Electron Test Equipment | Feb 2, 2018 | Burn-in Test
Wafer-level Test and Burn-in (WLTBI) refers to the process of subjecting semiconductor devices to electrical testing and burn-in while they are still in wafer form. The increasing complexity of SoC (System on Chip: commonly known as an “IC” or “chip”) has placed...
by Electron Test Equipment | Jan 15, 2018 | Burn-in Test
Semiconductor equipment that test and screen out early failures during the “infant mortality” stage are put on a board known as “Burn-in Board”. On a burn-in board, there are multiple sockets to place the semiconductor device (ie. laser diode or photodiode). The...
by Electron Test Equipment | Jan 1, 2018 | Semiconductor Testing
Learn more about our various reliability testing services including our ALT Testing Services. The article below explains the process of Accelerated Life Testing and why it is important to your engineering team. An Accelerated life Test (ALT) applies to the type of...
