by Electron Test Equipment | Feb 2, 2018 | Burn-in Test
Wafer-level Test and Burn-in (WLTBI) refers to the process of subjecting semiconductor devices to electrical testing and burn-in while they are still in wafer form. The increasing complexity of SoC (System on Chip: commonly known as an “IC” or “chip”) has placed...
by Electron Test Equipment | Jan 1, 2018 | Semiconductor Testing
Learn more about our various reliability testing services including our ALT Testing Services. The article below explains the process of Accelerated Life Testing and why it is important to your engineering team. An Accelerated life Test (ALT) applies to the type of...
