+353 1 902 6678 [email protected]

Knowledge Base

Burn-in Chamber

A burn-in chamber is an environmental oven used to evaluates the reliability of multiple semiconductor devices and performs large capacity screenings for premature failure (infant mortality). These environmental chambers are designed for static and dynamic burn-in of...

read more

Burn-in Board for Reliability Testing

Semiconductor equipment that test and screen out early failures during the “infant mortality” stage are put on a board known as “Burn-in Board”. On a burn-in board, there are multiple sockets to place the semiconductor device (ie. laser diode or photodiode). The...

read more

Accelerated Life Testing

An Accelerated life Test (ALT) applies to the type of test where failure times can be accelerated by applying higher "stress" to the component or semiconductor device. Rather than test the device at normal use conditions, Accelerated Life Testing can test...

read more
Page 3 of 3123