Knowledge Base
Burn-in Chamber
A burn-in chamber is an environmental oven used to evaluates the reliability of multiple semiconductor devices and performs large capacity screenings for premature failure (infant mortality). These environmental chambers are designed for static and dynamic burn-in of...
read moreBurn-in Board for Reliability Testing
Semiconductor equipment that test and screen out early failures during the “infant mortality” stage are put on a board known as “Burn-in Board”. On a burn-in board, there are multiple sockets to place the semiconductor device (ie. laser diode or photodiode). The...
read moreAccelerated Life Testing
An Accelerated life Test (ALT) applies to the type of test where failure times can be accelerated by applying higher "stress" to the component or semiconductor device. Rather than test the device at normal use conditions, Accelerated Life Testing can test...
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Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Ireland
Phone: + 353 1 902 6678
E-mail:
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