by Electron Test Equipment | Jul 15, 2018 | Laser Diodes, Semiconductor Testing
The majority of semiconductor device reliability modeling is done using the exponential probability distribution model, which assumes the semiconductor has a constant failure rate and there is no wear-out mechanism. However, there are a number of factors which affect...
by Electron Test Equipment | Jul 12, 2018 | Semiconductor Testing
We expect our cars, computers, electrical appliances, lights, televisions, etc. to function whenever we need them – day after day, year after year. In today’s technological world nearly everyone depends upon the continued functioning of a wide array of...
by Electron Test Equipment | Jun 26, 2018 | Laser Diodes
Laser diodes, the devices that illuminate telecom fiber-optic cables, require light-current-voltage (LIV) measurements during production. These measurements let you characterize a laser diode’s light output and forward voltage as a function of input current....
by Electron Test Equipment | May 15, 2018 | Semiconductor Testing
Learn more about our various reliability testing services including our HALT Testing Services. The article below explains the process of HALT and why it is important. Highly accelerated life testing (HALT) is a method used to test solid-state electronics and determine...
by Electron Test Equipment | Apr 28, 2018 | Photodiodes
The job of the photodiode to convert the light energy received from the laser diode into electrical energy. Photons absorbed by the photodiode excite electrons within the photodiode in a process called intrinsic absorption. When stimulated with an outside bias...
