LIV Test System for Laser Diodes
The light-current-voltage (LIV) sweep test is a fundamental measurement to determine the operating characteristics of a laser diode.
Our LIV Test System is designed for applications
that require the highest measurement accuracy and testing of up to 1024 devices at the same time.
Combined Source & Measurement
The versatile LIV Test System combines source and measurement devices into one system. The LIV Test System is a compact and cost-effective Source/Measure Unit (SMU) with the capability to output and measure both voltage and current of 64 to 1024 laser diode devices. The LIV Test System provides the capability to assess the laser characteristics of all devices across all four measurement quadrants without the need for additional equipment.
Source Voltage
Source Current
Meter Voltage
Meter Current
How The LIV Test System Works
Semiconductor diodes are placed in an environmental chamber at a set temperature and current and is applied to the laser diodes at interval steps (LIV test sweep) and the intensity of the resulting emitted light and voltage is measured.
The final laser diode LIV test results are displayed onto a graph which is known as an “LIV curve”. The following characterization can be determined based on the LIV measurement: Power vs. current ; Power vs. voltage ; Threshold current ; Series resistance ; Slope efficiency.
LIV Test System Features
The custom LIV Test System comes with various hardware configurations and is customizable for various LIV test conditions for your laser diode.
Standard Features include:
- Test 64 to 1024 laser diodes
- Easily switch DUT (device under test) boards from TO-Can to Butterfly package
- Power Monitoring & UPS Backup
- Ethernet Communication
- Custom Input & Output Interface Connectors
- Custom interface control with third-party environmental chambers
- An easy to use GUI software provides real-time testing and functional reports
Test Standards
With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.
Packaged IC
For packaged ICs, we manufacture a custom interface fixture for packaged lasers to ensure proper connectivity and test reliability.
Software Support
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
Designed to Work With All Environmental Test Chambers
The LIV Test System works with all environmental test chambers for various environmental conditions for your laser diode.
Specifications & Gallery
| Reliability Test | LIV Results |
| Measured Quantities | LIV Curve |
| Number Test Components | 64 – 1024 |
| Voltage Accuracy (Measured) | 0.1% + -15mV |
| Current Range | 1mA – 5,000 mA |
| Current Accuracy (Measured) | 0.1% of Full Scale |
| Source Measure Board | Custom Interface Test Fixture |
| Voltage Programming Resolution | 0.1 V to 5 V, 64 steps |
| Maximum Current | 5,000mA |
| Default Current Measurement Resolution | Analog to Digital 13 bit |
| Scan Time | 2 to 6 seconds |
| Input Voltage | 110V – 240V AC |
| Power Consumption | 220 Watts |
| System Dimensions (mm) | L-515 x W-477 x H-395 (size based on 64 component testing) |
| Material: | Aluminum/Steel |
HEAD OFFICE
Electron Test Equipment Limited
44 Brighton Road
Salfords, RH1 5BX
England
Phone: + 44 1293 904 001
E-mail:
info@electrontest.com