Laser Diode Burn-in & Reliability Test System
The custom ATE Laser Diode Burn-in & Reliability Test System is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for up to 1024 laser diodes specifically used in telecommunication, satellite, aerospace and military applications.
Why Use Accelerated Lifetime Testing & Burn-in for Laser Diodes
With the rapid advancements in the electronics industry, reliability is a concern in every laser diode application. Laser diode life testing or accelerated aging is extremely important as part of qualification during product development as well
as for batch testing throughout the production life of the laser.
As well, high-temperature burn-in tests are used in laser diode manufacturing to filter out components that will be prone to premature failure and ensure the remaining lot of laser diodes will meet the acceptable level of reliability based on the test standard used.
Versatile Temperature Control
With the rise of 400G communication networks and higher accuracy laser guided devices used in military applications, semiconductor manufacturers are required to test their laser diodes in extreme environmental conditions.
The ATE Laser Diode Test System is versatile and will work with your existing environmental chambers or can be equipped with a chamber that can maintain demanding temperature conditions:
- Sub-zero thermal shock (as low as -75° C)
- Humidity ( 20% to 95% RH)
- High temperatures ( up to 180° C) for burn-in and accelerated aging
Laser Diode Control Modes
Automatic Constant Current
In ACC mode the laser diode’s output power is held constant by continuously adjusting current as required to maintain constant output power. The system Optical output power is measured by using an internal monitor photodiode if one is available within the laser.
Light Current Voltage (L-I-V)
By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode.
Automatic Power Control
In APC mode, the system monitors the optical output and provides a control signal for the laser diode which maintains the operation at a constant optical output level. Optical output power is measured either with an external or photodiode within the laser.
Laser Diode Burn-in
The laser diode burn-in test can be used to test up from 64 to 1024 laser diodes at a time to identify and remove faulty lasers that would experience pre-mature failure in the field.
With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
Designed to Work With All Environmental Test Chambers
The PRT-LASER works with all environmental test chambers for various stress tests for your laser diode semiconductor:
- High Temperature Operating Life Test (HTOL)
- Low Temperature Operating Life Test (LTOL)
- Temperature and Humidity Test
- Temperature and Humidity Bias Test (THB)
- Autoclave Test
- Highly Accelerated Stress Test (HAST), Bias or Unbiased
- High Temperature Storage
- Moisture Sensitivity Level
- Moisture Pre-conditioning
Specifications & Gallery
|Reliability Test||FIT (Failure In Time), MTTF (Mean Time to Failure)|
|Measured Quantities||LIV Curve, Threshold Current, Operating Current, Forward Voltage, Monitoring Current, Vmax, Imax, Imin|
|Number Test Components||64 – 1024|
|Voltage Accuracy (Measured)||0.1% + -15mV|
|Current Range||1mA – 5,000 mA|
|Current Accuracy (Measured)||0.1% of Full Scale|
|Source Measure Board||Custom Interface Test Fixture|
|Voltage Programming Resolution||0.1 V to 5 V, 64 steps|
|Default Current Measurement Resolution||Analog to Digital 13 bit|
|Scan Time||2 to 6 seconds|
|Input Voltage||110V – 240V AC|
|Power Consumption||220 Watts|
|System Dimensions (mm)||L-515 x W-477 x H-395 (size based on 64 component testing)|
Increases semiconductor reliability through precise and affordable semiconductor reliability testing that measures 64 to 1024 laser diode semiconductors in sub-zero, humidity, and high temperature conditions.
Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Phone: + 353 1 902 6678