Laser Diode Burn-in &
Reliability Test System
The custom ATE Laser Diode Burn-in & Reliability Test System is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for up to 1024 laser diodes specifically used in telecommunication, satellite, aerospace and military applications.
Types of Reliability Tests for Laser Diodes
The versatile PRT-LASER provides three easy testing conditions at your facility for semiconductor laser diodes.
Laser Diode Burn-in Test
Laser Diode Accelerated Aging
Laser Diode Qualification Testing
Why Use Accelerated Lifetime Testing & Burn-in for Laser Diodes
With the rapid advancements in the electronics industry, reliability is a concern in every laser diode application. Laser diode life testing or accelerated aging is extremely important as part of qualification during product development as well
as for batch testing throughout the production life of the laser.
As well, high-temperature burn-in tests are used in laser diode manufacturing to filter out components that will be prone to premature failure and ensure the remaining lot of laser diodes will meet the acceptable level of reliability based on the test standard used.
Electron Test Equipment manufacturers the PRT-LASER Product Reliability Tester which is a portable and modular system that works with all environmental chambers for accelerated life testing and burn-in tests of up to 1024 laser diode semiconductor components at a time.
The custom PRT-LASER comes with various hardware configurations and is customizable for various reliability test and burn-in conditions for your semiconductor laser diode.
Standard Features include:
- Test up to 1024 semiconductor laser diodes
- Power Monitoring & UPS Backup
- Ethernet Communication
- Custom Input & Output Interface Connectors
- Custom interface control with third-party environmental chambers
Laser Diode Burn-in
The laser diode burn-in test can be used to test up to 1024 laser diodes at a time to identify and remove faulty lasers that would experience pre-mature failure in the field.
With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.
Wafer Level Testing
For wafer level testing, we provide custom designed wafer probers and test fixtures for all laser diode applications.
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
For packaged ICs, we manufacture a custom interface fixture for packaged lasers to ensure proper connectivity and test reliability.
Designed to Work With All Environmental Test Chambers
The PRT-LASER works with all environmental test chambers for various stress tests for your laser diode semiconductor:
- High Temperature Operating Life Test (HTOL)
- Low Temperature Operating Life Test (LTOL)
- Temperature and Humidity Test
- Temperature and Humidity Bias Test (THB)
- Autoclave Test
- Highly Accelerated Stress Test (HAST), Bias or Unbiased
- High Temperature Storage
- Moisture Sensitivity Level
- Moisture Pre-conditioning
|Reliability Test||FIT (Failure In Time), MTTF (Mean Time to Failure)|
|Measured Quantities||LIV Curve, Threshold Current, Operating Current, Forward Voltage, Monitoring Current, Vmax, Imax, Imin|
|Number Test Components||64 – 1024|
|Voltage Accuracy (Measured)||0.1% + -15mV|
|Current Range||1mA – 5,000 mA|
|Current Accuracy (Measured)||0.1% of Full Scale|
|Source Measure Board||Custom Interface Test Fixture|
|Voltage Programming Resolution||0.1 V to 5 V, 64 steps|
|Default Current Measurement Resolution||Analog to Digital 13 bit|
|Scan Time||2 to 6 seconds|
|Input Voltage||110V – 240V AC|
|Power Consumption||220 Watts|
|System Dimensions (mm)||L-515 x W-477 x H-395 (size based on 64 component testing)|
Increases semiconductor reliability through precise and affordable semiconductor reliability testing that measures up to 1024 laser diode semiconductors simultaneously.
Electron Test Equipment Limited
3013 Lake Drive, Citywest Campus
Dublin 24, D24 PPT3
Phone: + 353 1 902 6678