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Laser Diode Burn-in &

Reliability Test System

The custom ATE Laser Diode Burn-in & Reliability  Test System is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for up to 1024 laser diodes specifically used in telecommunication, satellite, aerospace and military applications.

Types of Reliability Tests for Laser Diodes

The versatile PRT-LASER provides three easy testing conditions at your facility for semiconductor laser diodes.

photodiode burn-in test

Laser Diode Burn-in Test

 

photodiode burn-in test

Laser Diode Accelerated Aging

 

photodiode burn-in test

Laser Diode Qualification Testing

 

Why Use Accelerated Lifetime Testing & Burn-in for Laser Diodes

With the rapid advancements in the electronics industry, reliability is a concern in every laser diode application. Laser diode life testing or accelerated aging is extremely important as part of qualification during product development as well
as for batch testing throughout the production life of the laser.

As well, high-temperature burn-in tests are used in laser diode manufacturing to filter out components that will be prone to premature failure and ensure the remaining lot of laser diodes will meet the acceptable level of reliability based on the test standard used.

Electron Test Equipment manufacturers the PRT-LASER Product Reliability Tester which is a portable and modular system that works with all environmental chambers for accelerated life testing and burn-in tests of up to 1024 laser diode semiconductor components at a time.

PRT-LASER Features

The custom PRT-LASER comes with various hardware configurations and is customizable for various reliability test and burn-in conditions for your semiconductor laser diode.

Standard Features include:

  • Test up to 1024 semiconductor laser diodes
  • Power Monitoring & UPS Backup
  • Ethernet Communication
  • Custom Input & Output Interface Connectors
  • Custom interface control with third-party environmental chambers

Laser Diode Burn-in

The laser diode burn-in test can be used to test up to 1024 laser diodes at a time to identify and remove faulty lasers that would experience pre-mature failure in the field.

Test Standards

With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.

Wafer Level Testing

For wafer level testing, we provide custom designed wafer probers and test fixtures for all laser diode applications.

Software Support

Our dedicated support staff provides outstanding training and will help your team configure the software for your application.

Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.

Packaged IC

For packaged ICs, we manufacture a custom interface fixture for packaged lasers to ensure proper connectivity and test reliability.

Designed to Work With All Environmental Test Chambers

The PRT-LASER works with all environmental test chambers for various stress tests for your laser diode semiconductor:

  • High Temperature Operating Life Test (HTOL)
  • Low Temperature Operating Life Test (LTOL)
  • Temperature and Humidity Test
  • Temperature and Humidity Bias Test (THB)
  • Autoclave Test
  • Highly Accelerated Stress Test (HAST), Bias or Unbiased
  • High Temperature Storage
  • Moisture Sensitivity Level
  • Moisture Pre-conditioning
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Reliability Test FIT (Failure In Time), MTTF (Mean Time to Failure)
Measured Quantities LIV Curve, Threshold Current, Operating Current, Forward Voltage, Monitoring Current, Vmax, Imax, Imin
Number Test Components 64 – 1024
Voltage Accuracy (Measured) 0.1% + -15mV
Current Range 1mA – 5,000 mA
Current Accuracy (Measured) 0.1% of Full Scale
Source Measure Board Custom Interface Test Fixture
Voltage Programming Resolution 0.1 V to 5 V, 64 steps
Maximum Current 5,000mA
Default Current Measurement Resolution Analog to Digital 13 bit
Scan Time 2 to 6 seconds
Input Voltage 110V – 240V AC
Power Consumption 220 Watts
System Dimensions (mm) L-515 x W-477 x H-395 (size based on 64 component testing)
Material: Aluminum/Steel

Increases semiconductor reliability through precise and affordable semiconductor reliability testing that measures up to 1024 laser diode semiconductors simultaneously.