Semiconductor Reliability Testing
Electron Test has built a strong reputation as a leading supplier of custom semiconductor reliability testing solutions.
Our state-of-the-art automated test equipment ensures that modern semiconductor devices meet the highest standards of quality and performance.
We work with clients in aerospace, telecommunications, medical, automotive, or any other high-stakes industry. Our semiconductor reliability testing solutions are designed to cater to your specific needs.
Semiconductor Testing Solutions
Semiconductor testing is a critical process in the semiconductor industry that ensures the functionality and reliability of semiconductors and integrated circuits. This electrical testing involves a variety of tests, including reliability testing, functional testing, parametric testing, and accelerated testing to evaluate the performance and identify any potential defects in the devices.
Semiconductor Device Reliability Testing
Rigorous reliability testing is essential to predicting the lifespan and identifying weaknesses in your semiconductor package.
This includes identifying failure modes by pushing devices to their limits to uncover intrinsic reliability issues.
Contact us today for your customized quote.
Burn-In Testing
Our burn-in testing helps in detecting early failures and defects in your semiconductors. This process ensures that only reliable devices proceed to the next stages of the manufacturing or assembly process.
Additionally, high temperature operating life (HTOL) testing evaluates the lifespan and failure points of devices under extended exposure to high temperatures and electrical stress, providing critical insights into design robustness and real-world effectiveness.
Comprehensive Test Solutions
Our semiconductor testing equipment employs highly accelerated stress tests (HAST) to evaluate integrated circuits by simulating extreme conditions.
Additionally, we utilize intermittent operating life tests (IOL) to reveal reliability issues by cycling the device on and off, simulating the thermal and mechanical stresses encountered in real-world conditions.
Automated Test Equipment (ATE)
Our semiconductor testing systems are designed to test & measure 32 – 1024 devices. These systems include temperature cycle tests, which involve subjecting samples to varying extreme temperatures in a controlled environment to evaluate material response to thermal stress.
By subjecting semiconductors to thermal cycling in thermal testing, manufacturers can assess their durability and resistance to failure caused by repeated temperature fluctuations.
Why Choose Us?
Industry Expertise
With years of experience in the semiconductor industry, we understand the critical aspects of semiconductor testing and provide solutions that meet the highest standards.
Custom ATE Solutions
Our automated test equipment is equipped with advanced features to handle complex testing requirements, ensuring reliable and accurate results.
Customer Centered
We work closely with our clients to understand their specific needs and provide tailored solutions that ensure optimal performance and reliability.
Innovation
We are committed to continuous innovation and improvement in our testing processes, ensuring that we stay ahead in the industry and provide the best solutions to our clients.
Semiconductor Testing Devices with Highly Accelerated Stress Test
Our ATE Laser Diode Test System provides semiconductor testing of the following laser diodes which can be have been used in the following applications:
| Laser Diode Type | Aerospace and Defense | Medical and Health | Telecommunication | Automotive | Security and Surveillance |
|---|---|---|---|---|---|
| VCSEL | LIDAR for drones and autonomous vehicles | Optical coherence tomography (OCT) | Short-range optical communication, data centers | Gesture recognition, driver monitoring | Facial recognition, 3D imaging |
| DFB | High-precision range finding, target designation | Photodynamic therapy (PDT), fluorescence imaging | Long-haul optical communication, WDM systems | Vehicle-to-vehicle communication | Secure communication links |
| DPSS | Directed energy weapons, satellite communications | Skin resurfacing, laser surgery | Optical amplifiers, high-speed data links | LIDAR systems for autonomous driving | High-resolution imaging, surveillance |
| QCL | Spectroscopy for chemical detection, IR countermeasures | Breath analysis, non-invasive diagnostics | Terahertz communication systems | Gas sensing, pollutant detection | Chemical and biological threat detection |
| Fiber Laser | Laser designators, range finders | Tissue ablation, endoscopic surgery | Optical signal processing | Precision cutting, welding | Fiber optic sensors, perimeter security |
| Tunable Laser Diode | Communication in satellite and avionics systems | Diagnostic spectroscopy | Tunable WDM systems, flexible networks | Adaptive cruise control | Versatile threat detection, secure comms |
| Blue Laser Diode | High-density data storage, underwater communication | Ophthalmology, dental procedures | High-speed optical data storage | Head-up displays, lighting systems | Low-light imaging, enhanced surveillance |
| Infrared Laser Diode | Target acquisition, IR communication | Non-invasive medical imaging, IR thermography | IR data transmission, remote sensing | Night vision systems, parking sensors | Intrusion detection, thermal imaging |
| Ultraviolet Laser Diode | Micro-machining, component inspection | Dermatology, sterilization | Photolithography, high-density data storage | UV curing of materials | Document security, counterfeit detection |
Our ATE Photodiode Test System provides semiconductor testing for the following photodiode/photodetector types and their applications:
| Photodiode Type | Aerospace and Defense | Medical and Health | Telecommunication | Automotive | Security and Surveillance |
|---|---|---|---|---|---|
| Silicon PIN Photodiode | LIDAR systems, missile guidance | Pulse oximeters, blood glucose monitors | Optical fiber communication, signal monitoring | Rain sensors, light sensing for automatic headlights | Intrusion detection, motion sensors |
| InGaAs Photodiode | IR spectroscopy, thermal imaging | Near-infrared imaging, optical coherence tomography (OCT) | High-speed data transmission, WDM systems | Adaptive cruise control, night vision systems | Surveillance cameras, IR detection |
| Avalanche Photodiode (APD) | Range finding, laser range finders | PET scanners, fluorescence detection | Long-haul communication, optical receivers | LIDAR systems, driver assistance systems | High-sensitivity detection, low-light surveillance |
| Ge Photodiode | High-speed IR detection | IR spectrophotometers, tissue spectroscopy | Telecommunication networks, optical receivers | Infrared sensing, automotive LIDAR | Thermal imaging cameras, IR sensors |
| AlGaN Photodiode | UV detection, missile threat detection | UV sterilization monitoring, phototherapy | UV communication systems | UV sensing for pollution detection | Counterfeit detection, UV surveillance |
| Schottky Photodiode | High-speed detection for missile tracking | X-ray detection, medical imaging | High-speed optical communication | High-speed data links in vehicles | Rapid response surveillance systems |
| Multi-Junction Photodiode | Broad spectrum detection for defense applications | Broadband light therapy, diagnostic imaging | Broadband optical networks | Advanced driver assistance systems | Multi-spectral surveillance |
Our custom PCB boards can accept the following packages:
| Package Type | Description | Applications |
|---|---|---|
| TO-Can | Hermetically sealed, metal can package that protects the diode from dust and moisture. Common sizes include TO-18, TO-46, TO-56, and TO-9. | Laser pointers, fiber optic communications, medical devices, barcode scanners |
| Butterfly Package | Includes an integrated thermoelectric cooler (TEC) and often comes with a fiber pigtail for precise applications. | High-precision medical devices, telecommunications, fiber optic amplifiers |
| C-Mount | Simple, cost-effective package with a mounting base and a basic heat sink. | High-power laser diodes, industrial laser systems, medical laser equipment |
| DIL (Dual In-Line) | Compact package with pins for easy integration into circuit boards. | Pulse oximeters, medical diagnostic tools, optical communication modules |
| TOSA (Transmitter Optical Sub-Assembly) | Integrates a laser diode with optical components like lenses and isolators, often with fiber optic connectors. | Telecommunications, fiber optic transceivers, medical imaging devices |
| Chip on Submount (CoS) | Mounts the laser diode chip directly onto a heat-dissipating substrate. | Compact medical devices, high-power laser applications, laser projectors |
| SMD (Surface-Mount Device) | Compact package for mounting directly onto the surface of printed circuit boards (PCBs). | Consumer electronics, wearable devices, compact medical devices |
| TO-Can with Window | Similar to TO-can but with a window for optical applications. | Spectroscopy, optical sensors, environmental monitoring |
| PDIP (Plastic Dual In-line Package) | A plastic package with dual rows of pins for through-hole mounting. | Consumer electronics, laboratory equipment, communication devices |
Semiconductor Reliability Testing Applications
Aerospace & Defense
Semiconductor testing of Pulsed Laser Diodes used for range finding and targeting and photodiode testing of devices such as InGaAs APD, commonly used in NIR detection.
Telecommunication
Testing semiconductor laser diodes (VCEL, DFB, FB) and high-performance photodetectors used for high-speed communication in data centers & long-distance communication networks.
Medical & Health
Semiconductor testing of various wavelength diode lasers and DDPS lasers, packages (TO, Butterfly, CoS) used in ophthalmology, dermatology, or oncology.
Automotive
Testing of laser diodes DPSS, VCSEL and InGaAs, Avalanche photodiodes used in LIDAR for autonomous vehicles.
Research & Development
Testing of various laser & photodiode semiconductors for scientific instrumentation for research and technological development.
Security and Surveillance
Testing of semiconductor SPADs photodiodes and VCSEL for facial recognition.
Test Chambers
Our semiconductor reliability test systems are designed to provide versatile testing capabilities by incorporating external test chambers.
Unlike other systems that may be limited to a single size of laser for testing, our solution supports various laser sizes and accommodates a range of environmental test conditions.
This flexibility allows for comprehensive testing across different scenarios, ensuring that semiconductor devices are evaluated under realistic and extreme conditions to verify their performance and reliability.
Semiconductor Testing Software
Semiconductor reliability testing is a multifaceted process that involves careful design, rigorous testing, and high-quality manufacturing.
Failure analysis is essential in identifying root causes of failures during reliability tests, helping to implement corrective measures across different testing methodologies like board level reliability assessment and accelerated life testing.
Accelerated life testing (ALT) is a crucial component of reliability testing for semiconductor devices. This method involves subjecting the devices to extreme conditions, such as high temperatures, elevated voltages, and increased humidity levels, to accelerate their failure mechanisms.
Our automatic test equipment software implements a robust quality assurance process to monitor and evaluate each step of the testing process. This system helps identify and mitigate potential defects during the semiconductor manufacturing process and ensures that only the best semiconductor devices reach the market. Our focus is semiconductor reliability test equipment including laser diode and photodiode testing, excluding wafer testing or wafer test procedures, to provide precise and reliable results for advanced applications.
Frequently Asked Questions
Do you perform wafer testing?
Our ATE semiconductor testing equipment do not include wafer testing or wafer test procedures. Instead, we are dedicated to the specialized testing of laser diodes and photodiodes.
Our focus is on ensuring the highest quality and performance of these optoelectronic components through rigorous testing methodologies tailored to the specific characteristics of laser diodes and photodiodes.
What types of semiconductor testing do you perform?
- Package Testing: Testing the semiconductor device after it has been packaged.
- Burn-In Testing: Running the device at elevated temperatures and voltages to catch early failures.
- Parametric Testing: Measuring electrical parameters to ensure they meet specifications.
- Functional Testing: Verifying that the device performs its intended functions correctly.
Why is Semiconductor Testing Important?
Ensuring Quality and Reliability
Testing semiconductors is essential for maintaining the quality and reliability of these devices. It helps identify and eliminate defects early in the manufacturing process, ensuring that only high-quality products reach consumers. This is particularly important for the performance and reliability of electronic products used in critical applications such as aerospace and healthcare.
Meeting Industry Standards and Compliance
Semiconductors must adhere to strict industry standards and regulatory requirements. Testing ensures that each device meets these standards, which is vital in industries like automotive and medical, where the consequences of device failure can be severe.
Enhancing Performance
Performance testing verifies that semiconductor devices function correctly under various conditions, ensuring they meet electrical and functional specifications. High-performance standards are particularly important in fields like telecommunications, where devices must handle high data rates and demanding operational environments.
What equipment is used in semiconductor testing?
Each piece of equipment plays a specific role in the testing process.
What are common defects detected during semiconductor testing?
Common defects include electrical shorts, open circuits, incorrect doping levels, and various parametric deviations from the specified norms.
These defects can affect the performance, reliability, and longevity of semiconductor devices.
What is a semiconductor tester?
A semiconductor tester is a specialized piece of equipment used to evaluate the functionality, performance, and reliability of semiconductors. These testers are crucial in the semiconductor manufacturing process to ensure that the devices meet specified standards and are free of defects before they are used in electronic products.
These defects can affect the performance, reliability, and longevity of semiconductors.
Key Functions of Semiconductor Testers
- Defect Detection:
- Semiconductor testers identify defects in semiconductor packages. Early detection of defects is critical to preventing faulty devices from reaching the market.
- Performance Verification:
- These testers verify the electrical and functional performance of semiconductors, ensuring they meet required specifications.
- Reliability Testing:
- Semiconductor testers conduct reliability tests to evaluate how devices perform under various conditions, including temperature extremes, voltage variations, and prolonged use.
What kind of reliability testing do you do?
Reliability testing for extreme environments involves subjecting semiconductor devices to harsh conditions such as extreme temperatures, high humidity, and other environmental stressors.
This type of testing is designed to simulate real-world usage scenarios where devices may be exposed to challenging conditions. By evaluating how semiconductor devices perform under these extreme conditions, reliability testing ensures that they can maintain their functionality and reliability in demanding environments.
This is particularly important for applications in aerospace, defense, and other industries where device reliability is critical.
What is reliability testing?
Reliability testing is a crucial process in the development and production of semiconductor devices. It ensures that the devices meet the required standards of performance, quality, and reliability.
There are several types of reliability testing, each with its own unique characteristics and objectives..
Types of Semiconductor Reliability Testing
Accelerated Life Testing (ALT)
Accelerated life testing (ALT) subjects semiconductor devices to accelerated stress conditions to simulate the effects of time and usage.
By exposing devices to elevated temperatures, increased voltages, and other stress factors, ALT helps predict the long-term reliability and lifespan of the devices.
This type of reliability testing is invaluable for identifying potential issues and defects that could lead to failures, thereby enhancing the overall performance and durability of semiconductor products.
For more information about our semiconductor reliability testing solutions, please request a quote.
Our application engineers are ready to assist you with your testing needs and ensure that your semiconductor devices meet the highest standards of quality and performance.
HEAD OFFICE
Electron Test Equipment Limited
5a Whytecliffe Road South, Purley, CR8 2AY, England
Phone: + 44 1293 904 001
E-mail:
moc.tsetnortcele@su-tcatnoc