Semiconductor Tester
The custom ATE Laser Diode Burn-in & Reliability Test System is a module based system that provides a low cost, high performance, accelerated aging, burn-in, and qualification testing for up to 1024 laser diodes specifically used in telecommunication, satellite, aerospace and military applications.
Why Use Accelerated Lifetime Testing & Burn-in for Laser Diodes
With the rapid advancements in the electronics industry, reliability is a concern in every laser diode application. Laser diode life testing or accelerated aging is extremely important as part of qualification during product development as well
as for batch testing throughout the production life of the laser.
As well, high-temperature burn-in tests are used in laser diode manufacturing to filter out components that will be prone to premature failure and ensure the remaining lot of laser diodes will meet the acceptable level of reliability based on the test standard used.
Versatile Temperature Control
With the rise of 400G communication networks and higher accuracy laser guided devices used in military applications, semiconductor manufacturers are required to test their laser diodes in extreme environmental conditions.
The ATE Laser Diode Test System is versatile and will work with your existing environmental chambers or can be equipped with a chamber that can maintain demanding temperature conditions:
- Sub-zero thermal shock (as low as -75° C)
- Humidity ( 20% to 95% RH)
- High temperatures ( up to 180° C) for burn-in and accelerated aging
Devices That Can Be Tested
MOSFET Transistor Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
HEMT Transistor Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
FET Transistor Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
Optocoupler Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
TRIAC Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
MOV Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
OPTO Switch Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
DIAC Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
LED & OLED Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
Opto-Logic Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
Zener Diode Reliability
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
JFET Transistor
Your content goes here. Edit or remove this text inline or in the module Content settings. You can also style every aspect of this content in the module Design settings and even apply custom CSS to this text in the module Advanced settings.
Laser Diode Burn-in
The laser diode burn-in test can be used to test up from 64 to 1024 laser diodes at a time to identify and remove faulty lasers that would experience pre-mature failure in the field.
Test Standards
With advanced software test configurations, you can customize settings that meet various organization test standards such as the Telcordia (Bellcore) GR-468-CORE, MIL-STD-883E, and Test Method 1016.
Software Support
Our dedicated support staff provides outstanding training and will help your team configure the software for your application.
Depending on your requirements, the software can be customized to meet your semiconductor test requirements. When you choose an Electron Test Equipment product you not only get the most advanced semiconductor test equipment – you receive outstanding support and service.
Designed to Work With All Environmental Test Chambers
The PRT-LASER works with all environmental test chambers for various stress tests for your laser diode semiconductor:
- High Temperature Operating Life Test (HTOL)
- Low Temperature Operating Life Test (LTOL)
- Temperature and Humidity Test
- Temperature and Humidity Bias Test (THB)
- Autoclave Test
- Highly Accelerated Stress Test (HAST), Bias or Unbiased
- High Temperature Storage
- Moisture Sensitivity Level
- Moisture Pre-conditioning
Specifications & Gallery
| Reliability Test | FIT (Failure In Time), MTTF (Mean Time to Failure) |
| Measured Quantities | LIV Curve, Threshold Current, Operating Current, Forward Voltage, Monitoring Current, Vmax, Imax, Imin |
| Number Test Components | 64 – 1024 |
| Voltage Accuracy (Measured) | 0.1% + -15mV |
| Current Range | 1mA – 5,000 mA |
| Current Accuracy (Measured) | 0.1% of Full Scale |
| Source Measure Board | Custom Interface Test Fixture |
| Voltage Programming Resolution | 0.1 V to 5 V, 64 steps |
| Maximum Current | 5,000mA |
| Default Current Measurement Resolution | Analog to Digital 13 bit |
| Scan Time | 2 to 6 seconds |
| Input Voltage | 110V – 240V AC |
| Power Consumption | 220 Watts |
| System Dimensions (mm) | L-515 x W-477 x H-395 (size based on 64 component testing) |
| Material: | Aluminum/Steel |
Increases semiconductor reliability through precise and affordable semiconductor reliability testing that measures 64 to 1024 laser diode semiconductors in sub-zero, humidity, and high temperature conditions.
HEAD OFFICE
Electron Test Equipment Limited
44 Brighton Road
Salfords, RH1 5BX
England
Phone: + 44 1293 904 001
E-mail:
info@electrontest.com